Recent Investment Analysts’ Ratings Updates for PDF Solutions (PDFS)

A number of research firms have changed their ratings and price targets for PDF Solutions (NASDAQ: PDFS):

• 5/19/2026 – PDF Solutions had its “buy” rating reaffirmed by Rosenblatt Securities. They now have a $52.00 price target on the stock.
• 5/18/2026 – PDF Solutions had its “buy” rating reaffirmed by DA Davidson. They now have a $56.00 price target on the stock.
• 5/11/2026 – PDF Solutions was upgraded by Weiss Ratings from “sell (d)” to “sell (d+)”.
• 5/10/2026 – PDF Solutions was upgraded by Wall Street Zen from “hold” to “buy”.
• 5/8/2026 – PDF Solutions had its price target raised by Rosenblatt Securities from $47.00 to $52.00. They now have a “buy” rating on the stock.
• 5/2/2026 – PDF Solutions was downgraded by Wall Street Zen from “buy” to “hold”.
• 4/29/2026 – PDF Solutions had its price target raised by DA Davidson from $40.00 to $48.00. They now have a “buy” rating on the stock.
• 4/20/2026 – PDF Solutions had its price target raised by Rosenblatt Securities from $37.00 to $47.00. They now have a “buy” rating on the stock.
• 4/19/2026 – PDF Solutions was upgraded by Wall Street Zen from “hold” to “buy”.
• 4/11/2026 – PDF Solutions was downgraded by Wall Street Zen from “buy” to “hold”.
• 3/27/2026 – PDF Solutions had its “sell (d)” rating reaffirmed by Weiss Ratings.

PDF Solutions, Inc, headquartered in Santa Clara, California, is a technology company that provides data-driven solutions for the semiconductor manufacturing industry. Founded in 1991, the company specializes in software and services designed to improve yield, productivity and profitability for semiconductor fabricators. Over its history, PDF Solutions has positioned itself as a partner to foundries, integrated device manufacturers (IDMs), assembly and test operations, offering tailored data analytics and engineering expertise.

The company’s flagship offering, the Exensio platform, aggregates and analyzes data from process equipment, metrology and inspection systems to identify yield-limiting defects and process excursions.